The objective of the course is to provide a broad overview about different techniques available for structural characterization of various materials systems. It is an amalgamation of the science behind these characterization techniques and their application in material systems. The course is divided into two segments dealing with two major aspects of material structures and characterization; initial part will focus on imaging the microstructure by various microscopy techniques while the later part will deal with understanding the internal structure by diffraction phenomena. For this, the first set of lectures will introduce the fundamental issues of image formation and its inherent attributes and proceed towards details about specific imaging techniques e.g. light/optical microscopy and electron microscopy. Afterwards, the course will cover the basics of diffraction phenomena and related techniques using electron and X-ray sources. At all times, while dealing with these characterization techniques, their importance in materials research and application to real problem solving will be emphasized.INTENDED AUDIENCE : Final year UG and PG students and PhD research scholars from various disciplines like Materials and Metallurgical Engineering, Ceramic Engineering,Nanoscience and Nanotechnology, Physics, Chemistry,Materials Science etc.PRE-REQUISITES : Any introductory courses on Materials Science and EngineeringINDUSTRY SUPPORT :Industries dealing with metal making and processing (e.g. steel or Aluminum industries), semiconductor device making, biomedical applications etc.
Introduction to microscopy
Basic principles of image formation
General concepts of microscopy: resolution. Magnification, depth of field, depth of focus etc.